Universal X-ray diffractometer D5000 (Siemens)

• Horizontal four-axis goniometer with open Euler cradle
• arbitrary XYZ sample positioning X = ±30 mm, Y = ±25 mm, Z ≤ 12 mm

Technical details:

Rotation:

• 0° ≤ φ ≤ 360° (minimum step size φ = 0.01°)

Tilting:

• -65° ≤ ψ ≤ +91° (minimum step size ψ = 0.01°)

Primary beam path: 

• X-ray tube with co-anode and 1 mm ² -point focus
• Fe absorption filter
• Collimator
• Circular aperture
• Irradiated surface Ø 2 mm

Secondary beam path:  

• Counting tube cover
• Scintillation counter tube

Angle range:          

• -100° ≤ 2 θ ≤ 170°

Sample request:

• crystalline (compact, powdery)

Surface condition:

• just

Dimensions:

• typically approx. 2 cm × 2 cm × 1 cm

Software package:

• Diffrac ^plus (BRUKER AXS) with various evaluation modules

Phase analysis:

(qualitative/quantitative)

• EVA with PDF-2 database

• TOPAS with structural data files

Residual stress determination:

• STRESS

Texture analysis:

• TexEval