X-ray diffractometer D8 DISCOVER (Bruker AXS)

• Vertical goniometer in theta/theta configuration with centric Euler cradle for Bragg-Brentano and parallel beam geometry
• Measurement positioning with laser video system

Technical details:

Rotation:

• 0° ≤ φ ≤ 360° (minimum step size φ = 0.0002°)

Tilting:

• -11° ≤ ψ ≤ +97° (minimum step size ψ = 0.0002°)

Primary beam path: 

• X-ray tube with Cu anode and optional line or point focus
• Gap diaphragm for Bragg-Brentano geometry
• Göbel mirror or polycap for parallel beam geometry
• Irradiated area Ø ≥ 150 µm (point focus) and 3.5 cm × ≥ 2mm to 1 cm × 200 µm (line focus)

Secondary beam path:  optionally with

• Area detector (VǺNTEC–500)
• Point detector (scintillation counter)
• Energy dispersive point detector (Sol-XE)

Angle range:

• 0° ≤ 2 θ ≤ 130° (minimum step size 2 θ = 0.0001°)

Diffraction methods:

• Phase analysis (qualitative, quantitative)
• Determination of the degree of crystallinity
• Determination of the mean particle size
• (Intrinsic) stress analysis
• Texture analysis
• Measurement of layer thicknesses and interfacial roughnesses

Sample request:

• crystalline and/or amorphous (compact, powder, thin films)
• Maximum dimensions 10 cm × 10 cm × ≤ 3 cm