Andreas Furchner   [ We_A_I2 ] 
"QUANTIFYING MOLECULAR INTERACTIONS WITH IR ELLIPSOMETRY"

Rüdiger Goldhahn   [ Mo_A_I2 ] 
"ELLIPSOMETRY OF TRANSPARENT CONDUCTING OXIDES FROM MIDINFRARED INTO VACUUM ULTRAVIOLET"

Bruno Gompf   [ Tu_M_I1 ] 
"THE DEPOLARIZATION IN GRANULAR MEDIA: A MUELLER MATRIX APPROACH"

Kurt Hingerl   [ Mo_M_I1 ] 
"DECOHERENCE AND DEPOLARISATION AND THE INFLUENCE OF INNER BOUNDARIES OF METAMATERIALS ONTO DEPOLARISATION"

Tino Hofmann   [ We_M_I1 ] 
"ELLIPSOMETRY AT THZFREQUENCIES: NEW APPROACHES FOR METROLOGY AND METAMATERIAL-BASED SENSING"

Zsuzsanna Pápa   [ Mo_M_I2 ] 
"ELLIPSOMETRY OF THIN PEPTIDE FILMS"

Steffen Richter   [ We_M_I2 ] 
"FS-TIME-RESOLVED SPECTROSCOPIC ELLIPSOMETRY"

Georgeta Salvan   [ Mo_A_I1 ] 
"MAGNETO-OPTICAL KERR EFFECT SPECTROSCOPY OF MAGNETIC OXIDES AND ORGANIC/OXIDE HETEROSTRUCTURES"

Timur Shaykhutdinov   [ Tu_M_I2 ] 
"ANISOTROPY IN AGGREGATES AND THIN FILMS BY IR NANOPOLARIMETRY"

Stefan Zollner   [ We_A_I1 ] 
"INFLUENCE OF TEMPERATURE, STRAIN, ALLOY COMPOSITION, DOPING, AND FILM THICKNESS ON THE DIELECTRIC FUNCTION OF SEMICONDUCTORS"

Isabel Alonso   [ We_A_O2 ] 
"SPECTROSCOPIC ELLIPSOMETRY STUDY OF HYBRID PEROVSKITE SOLID SOLUTION FAXMA1?XPBI3 SINGLE CRYSTALS"

Elias Baron   [ Mo_A_O3 ] 
"PLASMONIC PROPERTIES OF DEGENERATELY GE-DOPED CUBIC GAN"

Peter Basa   [ We_M_O3 ] 
"CHARACTERIZATION OF DIELECTRIC FILMS ON GLASS FOR THE SEMICONDUCTOR 3D PACKAGING PROCESS"

Uwe Beck   [ Tu_M_O8 ] 
"ELLIPSOMETRIC IMAGING OF LOW-CONTRAST SURFACE MODIFICATIONS AND DEPOLARIZATION CONTRAST IMAGING (DCI) OF PARTICULATE ACCUMULATIONS"

Eva Bittrich   [ Mo_M_O6 ] 
"ZWITTERIONIC POLYMER SURFACES BASED ON PHOSPHORYLCHOLINE: SWELLING AND BIOMOLECULE INTERACTION"

Adrian Blümich   [ We_M_O7 ] 
"ELLIPSOMETRY IN THE ERA OF INDUSTRY 4.0"

Judit Budai   [ We_M_O5 ] 
"ULTRAFAST IN-SITU ELLIPSOMETRY FOR STUDYING INTERACTIONS OF LASER PULSES AND MATERIAL SURFACES"

Maurizio Canepa   [ Mo_M_O3 ] 
"SPECTROSCOPIC ELLIPSOMETRY CHARACTERIZATION OF HYBRIDIZATION OF DNA ON GOLD SURFACES"

Matthias Duwe   [ Tu_M_O5 ] 
"IMAGING MUELLER-MATRIX ELLIPSOMETRY OF ANISOTROPIC THIN-FILM SEMICONDUCTORS"

Shirly Espinoza   [ Mo_A_O1 ] 
"VUV MAGNETO-OPTICAL TRANSIENT ELLIPSOMETER: ELIPS"

Miklos Fried   [ We_M_O2 ] 
"HIGH SPEED SPECTROSCOPIC ELLIPSOMETRY TECHNIQUE FOR ON-LINE MONITORING IN LARGE AREA THIN LAYER PRODUCTION"

Sebastian Funke   [ Tu_M_O6 ] 
"ELLIPSOMETRIC MICROMAPPING OF GRAPHENE GROWN ON COPPER-FOIL"

Martin Hammerschmidt   [ Tu_M_O1 ] 
"QUANTIFYING UNCERTAINTIES OF RECONSTRUCTED PARAMETERS IN OPTICAL SCATTEROMETRY OF NANOSTRUCTURED SURFACES"

Andreas Hertwig   [ Mo_M_O4 ] 
"DETERMINATION OF THE GLASS TRANSITION REGION OF PVME BY MEANS OF SPECTROSCOPIC ELLIPSOMETRY"

Alexander Horn   [ We_M_O6 ] 
"ULTRAFAST ELLIPSOMETRY OF LASER-INDUCED PHASE TRANSITIONS IN MATTER"

Lars Jansen   [ We_M_O4 ] 
"HIGH-SPEED SPRECTROSCOPIC ELIIPSOMETRY AND ITS APPLICATIONS"

Søren A. Jensen   [ Tu_M_O3 ] 
"ROUGH CIGS SURFACE ANALYZED WITH RAYLEIGH-RICE THEORY"

Evgeny Krüger   [ Mo_A_O4 ] 
"TEMPERATURE DEPENDENT DIELECTRIC FUCTION OF CUI THIN FILMS"

Philipp Kühne   [ We_A_O3 ] 
"STEALTH TECHNOLOGY-BASED TERAHERTZ FREQUENCY-DOMAIN ELLIPSOMETRY INSTRUMENTATION"

Dmitriy V. Likhachev   [ We_M_O8 ] 
"USE OF P-SPLINES FOR THE DIELECTRIC FUNCTION REPRESENTATION IN THE INTERPRETATION OF SPECTROSCOPIC ELLIPSOMETRY DATA"

Michele Magnozzi   [ Tu_M_O7 ] 
"FAST DETECTION OF WATER NANOPOCKETS UNDERNEATH WET-TRANSFERRED GRAPHENE"

Alyssa Mock   [ Mo_A_O8 ] 
"OPTICAL AND ELECTRONIC PROPERTIES OF LOW-SYMMETRY MATERIALS"

Wojciech Ogieglo   [ Mo_M_O2 ] 
"ULTRA-THIN POLYMERS OF INTRINSIC MICROPOROSITY IN FLUIDS"

Rolf Reineke-Koch   [ Mo_A_O5 ] 
"MAGNETRON SPUTTERED TIOX LAYERS: STRUCTURAL, ELECTRICAL, OPTICAL AND THERMOCHROMIC ASPECTS"

Felix Rösicke   [ Mo_M_05 ] 
"GRAPHENE FUNCTIONALIZED BY ULTRA-THIN ANCHOR LAYERS TOWARDS BIOSENSOR APPLICATION"

René Sachse   [ Tu_M_O4 ] 
"SPECTROSCOPIC ELLIPSOMETRY FOR THE DETERMINATION OF THICKNESS AND POROSITY OF MESOPOROUS METAL OXIDE FILMS"

Apoorva Sharma   [ Mo_A_O2 ] 
"MAGNETO-OPTICAL SPECTROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY OF CO60FE20B20 THIN FILMS"

Wanfu Shen   [ Tu_M_O2 ] 
"AZIMUTHAL DEPENDENCE OPTICAL ANISOTROPY AT THE EDGES OF MICROSTRUCTURE"

Lukasz Skowronski   [ We_M_O1 ] 
"ELLIPSOMETRIC STUDY OF THE TIO2-BASED DECORATIVE COATINGS PRODUCED USING MAGNETRON SPUTTERING TECHNIQUE AT INDUSTRIAL CONDITIONS"

Mihai Stoica   [ We_A_O1 ] 
"ELLIPSOMETRIC STUDY ON TIO2 / ZNO BILAYER LAMINATE FILMS FOR PIEZOELECTRIC APPLICATIONS"

Chris Sturm   [ Mo_A_O6 ] 
"DIELECTRIC FUNCTION OF E-(IN,GA)2O3 THIN FILMS"

Cordula Walder   [ Mo_M_O1 ] 
"INFRARED SPECTROSCOPIC ELLIPSOMETRY OF SIO2 TRAPEZOIDS AND BIOHYBRID SIO2/PROTEIN INTERFACES"

Vitaly Zviagin   [ Mo_A_O7 ] 
"SPECTROSCOPIC INVESTIGATION OF CATION CONFIGURATION STATE OF SPINEL FERRITE THIN FILMS"

[ P01 ]  Theo Pflug
"CASE STUDY ON THE DYNAMICS OF ULTRAFAST LASER HEATING AND ABLATION OF GOLD THIN FILMS BY ULTRAFAST PUMP-PROBE ELLIPSOMETRY"

[ P02 ]  Markus Olbrich
"COMPARISON OF DIFFERENT MODELS DESCRIBING THE TEMPERATURE DEPENDENT DIELECTRIC FUNCTION: VALIDATION OF MODELS WITH TIME-RESOLVED PUMP-PROBE REFLECTOMETRY AND ELLIPSOMETRY"

[ P03 ]  Oliver Herrfurth
"PITFALLS OF TIME-RESOLVED SPECTROSCOPIC ELLIPSOMETRY"

[ P04 ]  Andreas Hertwig
"CALIBRATION SAMPLES AND THE GUM-COMPLIANT DETERMINATION OF UNCERTAINTIES IN ELLIPSOMETRY – A STANDARDIZATION INITIATIVE"

[ P05 ]  Eugene Bortchagovsky
"THE CHOICE OF OPTIMAL CONDITIONS OF ELLIPSOMETRIC MEASUREMENTS FOR ACCURATE DETERMINATION OF PARAMETERS OF INVESTIGATED SYSTEMS."

[ P06 ]  Krzysztof Dorywalski
"HYBRID GA-GRADIENT METHOD FOR THIN FILMS ELLIPSOMETRIC DATA EVALUATION"

[ P07 ]  Tobias Grunewald
"A NEW MERIT FUNCTION FOR MUELLER MATRIX ELLIPSOMETRY AND ITS APPLICATION ON SUBWAVELENGTH GRATINGS"

[ P08 ]  Andreas Furchner
"INFRARED MüLLER MATRIX ELLIPSOMETRY OF THIN FILMS AND STRUCTURED SURFACES"

[ P09 ]  Martin Čermák
"USE OF THE EXACT APPROACH OF THE RAYLEIGH–RICE THEORY FOR CALCULATING ELLIPSOMETRIC PARAMETERS AND REFLECTANCE OF MULTILAYER SYSTEMS WITH RANDOMLY ROUGH BOUNDARIES"

[ P10 ]  Kamil Postava
"MODELING OF ELLIPSOMETRIC RESPONSE FROM PERIODIC STRUCTURE INCLUDING INCOHERENT PROPAGATION IN THICK LAYERS"

[ P11 ]  Judit Budai
"ELLIPSOMETRIC ANALYSIS OF ALIGNED CARBON NANOTUBES"

[ P12 ]  Michele Magnozzi
"SPECTROSCOPIC ELLIPSOMETRY ANALYSIS OF SELF-ASSEMBLED AU/PNIPAM CORE-SHELL NANOPARTICLES"

[ P13 ]  Francesco Bisio
"TEMPERATURE-DEPENDENT OPTICAL PROPERTIES OF PLASMONIC NANOSYSTEMS"

[ P14 ]  Sandhya Chandola
"OPTICAL CHARACTERISATION OF ELECTRONIC CONFINEMENT IN THIN METALLIC FILMS GROWN ON 1-D NANOSTRUCTURES"

[ P15 ]  Sebastian Funke
"IMAGING ELLIPSOMETRY AS A TOOL FOR THE CHARACTERIZATION OF 2D-MATERIALS ON VARIOUS SUBSTRATES"

[ P16 ]  Constance Schmidt
"IMAGING ELLIPSOMETRY WITH CON-LOCAL RAMAN SPECTROSCOPY ON 2D TRANSITION METAL DICHALCOGENIDES WITH DIFFERENT LAYER THICKNESSES"

[ P17 ]  Shun Okano
"THE INFLUENCE OF FIELD EFFECT DOPING ON THE OPTICAL PROPERTIES OF BILAYER GRAPHENE"

[ P18 ]  Premysl Marsik
"PHONON ANOMALIES IN STRAINED SRMNO3 FILMS"

[ P19 ]  Chris Sturm
"DIELECTRIC FUNCTION AND SINGULAR OPTIC AXES OF KTP"

[ P20 ]  Ievgen Voloshenko
"MUELLER MATRIX ELLIPSOMETRY INVESTIGATIONS OF INSULATOR METAL TRANSITION IN VO2"

[ P21 ]  Farzin Abadizaman
"MUELLER MATRIX ANOMALY NEAR THE CURIE TEMPERATURE OF NI"

[ P22 ]  Dmitriy V. Likhachev
"DIFFERENT PARAMETERIZATION OF THE TIN OPTICAL PROPERTIES FOR SPECTROSCOPIC ELLIPSOMETRY–X-RAY REFLECTOMETRY COMPARISON"

[ P23 ]  Tomasz Rerek
"THE INFLUENCE OF DEPOSITION RATE ON MICROSTRUCTURE AND OPTICAL PROPERTIES OF THE SN THIN LAYERS"

[ P24 ]  Saulius Tumėnas
"TEMPERATURE DEPENDENCE OF ZINC R101 ENERGY GAP"

[ P25 ]  Jiri Vohánka
"OPTICAL CHARACTERIZATION OF NON-STOICHIOMETRIC SILICON NITRIDE FILMS PREPARED BY MAGNETRON SPUTTERING"

[ P26 ]  Daniel Franta
"OPTICAL CHARACTERIZATION OF HYDROGENATED AMORPHOUS SILICON-CARBON FILMS IN A WIDE SPECTRAL RANGE"

[ P27 ]  Lukasz Skowronski
"DIELECTRIC FUNCTIONS OF TITANIUM IN THE REGIME OF THE LIMITED LIGHT PENETRATION"

[ P28 ]  Oldrich Zmeskal
"THE INFLUENCE OF BALL-MILLING ON THE OPTICAL PROPERTIES OF PRINTED TITANIA PATTERNS REINFORCED BY ORGANOSILOXANE BINDER"

[ P29 ]  Lukasz Skowronski
"THE OPTICAL TIO2 LAYERS DEPOSITED ON POLYMER SUBSTRATES"

[ P30 ]  Lukasz Skowronski
"OPTICAL AND MICROSTRUCTURAL CHARACTERIZATION OF THICK TIO2 LAYERS PRODUCED USING MAGNETRON SPUTTERING TECHNIQUE"

[ P31 ]  Przemyslaw Sedzicki
"EFFECTS OF PHOSPHOROUS IONS IMPLANTATION IN BULK CDTE CRYSTAL"

[ P32 ]  Przemyslaw Sedzicki
"OPTICAL PROPERTIES OF COBALT/CHROMIUM DOPED BULK ZNSE"

[ P33 ]  Sven Peters
"SPECTROSCOPIC ELLIPSOMETRY FOR THE ANALYSIS OF ANISOTROPIC WIDE BAND GAP SEMICONDUCTORS"

[ P34 ]  Florian Bärwolf
"SPECTROSCOPIC ELLIPSOMETRY, SIMS AND X-RAY DIFFRACTOMETRY AND REFLECTOMETRY FOR GE-GRADED SIGE HBT CONTROL"

[ P35 ]  Nerijus Armakavicius
"ELECTRON EFFECTIVE MASS IN IN0.33GA0.67N DETERMINED BY INFRARED OPTICAL HALL EFFECT"

[ P36 ]  Attila Sütő
"IMAGING SPECTROSCOPIC ELLIPSOMETER FOR OLED APPLICATION"

[ P37 ]  Peter H. Thiesen
"OPTICAL CHARACTERIZATION OF ANISOTROPIC THIOPHENE-PHENYLENE CO-OLIGOMER MICRO CRYSTALS BY SPECTROSCOPIC IMAGING ELLIPSOMETRY."

[ P38 ]  Eva Bittrich
"THE GLASS TRANSITION IN POLYIMIDE FILMS USED FOR MICROELECTRONIC PACKAGING"

[ P39 ]  Maurizio Canepa
"OPTICAL PROPERTIES OF AMORPHOUS SIO2-TIO2 MULTI-NANOLAYERED COATINGS FOR 1064-NM MIRROR TECHNOLOGY"

[ P40 ]  Peter Basa
"STABLE AND REPRODUCIBLE POROUS COATINGS FOR SMART WINDOW APPLICATIONS"

[ P41 ]  Peter H. Thiesen
"CHARACTERIZATION OF THIN FILMS AT DISADVANTAGEOUS INTERFACES BY IMAGING ELLIPSOMETRY"

[ P42 ]  Peter H. Thiesen
"IMAGING ELLIPSOMETRY AT THE AIR/WATER INTERFACE"

[ P43 ]  Benjamin Kalas
"DETECTION AND CONTROL OF SURFACE NANOSTRUCTURES AT WATER LIQUID INTERFACE FOR SENSING"

[ P44 ]  Karsten Hinrichs
"OPTOFLUIDIK PLATFORM FOR ENHANCED IR MICROSCOPIC SENSING"

[ P45 ]  Christian Hoffmann
"CHARACTERIZATION OF EXTRUDED COLLAGEN FIBRES WITH IMAGING ELLIPSOMETRY"

[ P46 ]  Elisabeth Preuße
"SPECTROSCOPIC ELLIPSOMETRY OF ADSORBED PROTEINS ON BIOCERAMIC IMPLANT MATERIAL"